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Final Test
Final Test

Next Generation Test Cell 

In a primitive form of Final Test, a test cell is composed of a handler, a tester and a tester workstation that communicates with the handler over a GPIB, parallel or serial communications interface. Within this test cell, an operator divides his time between multiple testers, performing many tasks and, when or if time allows, checks whether any testers are running out-of-control.

In contrast, JCET has evolved to a Next Generation Test Cell that includes an Automatic Test Cell Controller and a Tester Utilization Tracking System connected to the communications interface between tester 

and handler that monitors all the activity between tester and handler (see photo below).


Real-Time Monitoring and Control

The Tester Utilization Tracking System automatically captures the actual, real-time tester utilization where productive time is actual test time + actual index time and all other time is a category of waste. Utilization trends are displayed on a utilization monitor next to the tester workstation.

At the same time, the Automatic Test Cell Controller is continuously monitoring the good yield, the yield variation between test sites and the failure rates for all hard and soft bins looking for pre-defined out-of-control events. When it detects an out-of-control event, the Auto Controller automatically stops the tester and activates an alarm to immediately bring line support technicians into the test cell to fix the problem.

This Next Generation Test Cell also includes a scanner to avoid manual entry mistakes. Test hardware used in production at JCET is bar-coded along with the Lot ID on the Lot Traveler.

Automatic Closed Loop Process Control

This Next Generation Test Cell enables automatic closed loop process control, which JCET utilizes to keep test manufacturing processes under control at all times.

Handler Equipment

At the core of a Final Test cell is a test platform and a handler. The following table highlights the primary handling equipment used for Final Test atJCET.


 

 Temperature   Capability

 Range 

 Handler Manufacturers

 Models

 Pick and Place

 Ambient to Hot


 Seiko Epson

 Northstar series


 Ambient to Hot


 Synax

 SX series


 Ambient to Hot


 Delta Design 

 Delta EDGE


 Ambient to Hot


 Hontech

 HT9045W


 Tri-Temp


 Multitest

 MT 9510


 Tri-Temp

 -60 oC to 160 oC 

 Delta Design 

 Delta Castle


 Tri-Temp


 Synax

 SX141C

 Gravity Feed 

 Ambient to Hot


 Multitest

 MT8, MT9 series


 Ambient to Hot  


 MCT

 3608


 Ambient to Hot  


 Symtek

 300 series


 Tri-Temp  


 Multitest

 MT8, MT9 series


 Tri-Temp 

 -60 oC to 160 oC  

 Rasco

 SO series


 Tri-Temp


 Aseco

 S series

 Turret

 Ambient


 SRM

 XD series

 High Parallel Memory Test

 Tri-Temp


 Mirae

 M440

 High Parallel Strip Test 

 Ambient


 TESEC 

 3270-IHR

 System Level Test 

 Ambient to Hot

 25 oC to 125 oC  

 Chroma

 3620*




 Hontech

 3000

Other types of handling equipment are available at JCET factories to satisfy special customer requests. Contact JCET to request other handlers not highlighted in the table.

Small Package Handling

For package body sizes less than 3×3 mm, JCET recommends either a turret handling solution or a strip test solution. JCET’s turret handlers integrate tape and reel creating a continuous manufacturing flow from Final Test into Post Test to improve throughput.

Burn-In Services

JCET offers sophisticated Burn-In systems with deep vector memory for dynamic Burn-In. Vector memory enables high fault coverage during the Burn-In process. JTAG testing and boundary scan can also be performed during Burn-In.

JCET has established close working relationships with subcontractors whose core business is Burn-In. By extending its Burn-In capabilities to include outside Burn-In specialists, JCET can take advantage of proprietary technology, techniques and Burn-In patterns from these vendors to satisfy any special customer requirements.

JCET also provides services for design and development of Burn-In boards and vector memory patterns for dynamic Burn-In.

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保留一切權利
蘇ICP備05082751號 32028102000607
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